Statistics
Publications
1
Citations
16
H-Index
1
Active since
2015
Affiliations
Xavier Bonnaud is an author at Singapore Institute of Manufacturing Technology specializing in atomic force microscopy, tip interaction, and surface characterization.
Publications per year
2015–2015
1
1
Interactions of higher order tip effects in critical dimension-AFM linewidth metrology
Ronald G. Dixson, Boon Ping Ng, Xavier Bonnaud et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2015 · 16 citations
Natural Sciences, Materials Science, Materials Characterization +15
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