Dawid Kot

Investigation of the Copper Gettering Mechanism of Oxide Precipitates in Silicon

G. Kissinger, Dawid Kot, M. Klingsporn et al. · ECS Journal of Solid State Science and Technology · 2015 · 25 citations · Full text

Materials Science, Materials Engineering, Copper Oxide Materials +13

Characterization of Deep Levels Introduced by RTA and by Subsequent Anneals in n-Type Silicon

Dawid Kot, Teimuraz Mchedlidze, G. Kissinger et al. · ECS Journal of Solid State Science and Technology · 2012 · 17 citations · Full text

Engineering, N-type Silicon, Thermal Donors +16

Analysis of the Nucleation Kinetics of Oxide Precipitates in Czochralski Silicon

G. Kissinger, Dawid Kot, J. Dąbrowski et al. · ECS Transactions · 2008 · 17 citations

Engineering, Chemistry, Silicon On Insulator +16

Investigation of the Composition of the Si/SiO₂Interface in Oxide Precipitates and Oxide Layers on Silicon by STEM/EELS

G. Kissinger, Markus Andreas Schubert, Dawid Kot et al. · ECS Journal of Solid State Science and Technology · 2017 · 17 citations

Materials Science, Engineering, Crystalline Defects +13

Morphology of Oxygen Precipitates in RTA Pre-Treated Czochralski Silicon Wafers Investigated by FTIR Spectroscopy and STEM

Dawid Kot, G. Kissinger, Markus Andreas Schubert et al. · ECS Journal of Solid State Science and Technology · 2014 · 15 citations

Materials Engineering, Materials Science, Chemical Engineering +10