Teimuraz Mchedlidze

Residual stress in Si nanocrystals embedded in a SiO2 matrix

T. Arguirov, Teimuraz Mchedlidze, M. Kittler et al. · Applied Physics Letters · 2006 · 67 citations

Engineering, Materials Engineering, Materials Science +17

Regular Dislocation Networks in Silicon as a Tool for Nanostructure Devices used in Optics, Biology, and Electronics

M. Kittler, Xuegong Yu, Teimuraz Mchedlidze et al. · Small · 2007 · 50 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Direct detection of carrier traps in Si solar cells after light-induced degradation

Teimuraz Mchedlidze, Jörg Weber · physica status solidi (RRL) - Rapid Research Letters · 2014 · 26 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Influence of Dislocation Loops on the Near-Infrared Light Emission From Silicon Diodes

Tù Hoang, J. Holleman, P. LeMinh et al. · IEEE Transactions on Electron Devices · 2007 · 24 citations

Engineering, Electrical Engineering, Materials Science +17

Capability of photoluminescence for characterization of multi-crystalline silicon

Teimuraz Mchedlidze, W. Seifert, M. Kittler et al. · Journal of Applied Physics · 2012 · 20 citations

Engineering, Materials Engineering, Materials Science +17