Patrick Griffin

INTERNATIONAL REACTOR DOSIMETRY FILE: IRDF-2002

R. Paviotti-Corcuera, V. Zerkin, É. M. Zsolnay et al. · 2003 · 107 citations

Nuclear Engineering, Nuclear Safety, Engineering +1

Impact of lateral source/drain abruptness on device performance

M.Y. Kwong, Reza Kasnavi, Patrick Griffin et al. · IEEE Transactions on Electron Devices · 2002 · 60 citations

Low-power Electronics, Device Modeling, Electrical Engineering +12

Atomic scale effects of zirconium and hafnium incorporation at a model silicon/silicate interface by first principles calculations

Atsushi Kawamoto, John R. Jameson, Patrick Griffin et al. · IEEE Electron Device Letters · 2001 · 52 citations

Materials Engineering, Materials Science, Material Analysis +13

Neutron dosimetry with planar silicon p-i-n diodes

Anatoly Rosenfeld, M. Yudelev, Michael Lerch et al. · IEEE Transactions on Nuclear Science · 2003 · 35 citations

Niel Sensors, Electrical Engineering, Neutron Dosimetry +13

Neutron damage equivalence in GaAs

Patrick Griffin, J.G. Kelly, T.F. Luera et al. · IEEE Transactions on Nuclear Science · 1991 · 34 citations · Full text

Simulation Fidelity, Engineering, Nuclear Physics +16