Hamed F. Dadgour

Grain-Orientation Induced Work Function Variation in Nanoscale Metal-Gate Transistors—Part I: Modeling, Analysis, and Experimental Validation

Hamed F. Dadgour, Kazuhiko Endo, Vivek De et al. · IEEE Transactions on Electron Devices · 2010 · 173 citations

Engineering, Experimental Validation, Semiconductor Device +16

Modeling and analysis of grain-orientation effects in emerging metal-gate devices and implications for SRAM reliability

Hamed F. Dadgour, Kazuhiko Endo, Vivek De et al. · 2008 · 107 citations

Minimum Sized Circuits, Engineering, Semiconductor Device +20

Grain-Orientation Induced Work Function Variation in Nanoscale Metal-Gate Transistors—Part II: Implications for Process, Device, and Circuit Design

Hamed F. Dadgour, Kazuhiko Endo, Vivek De et al. · IEEE Transactions on Electron Devices · 2010 · 89 citations

Circuit Design Implications, Engineering, Nanodevices +16

A Novel Variation-Tolerant Keeper Architecture for High-Performance Low-Power Wide Fan-In Dynamic or Gates

Hamed F. Dadgour, Kaustav Banerjee · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2009 · 70 citations

Low-power Electronics, Hardware Security, Electrical Engineering +11

Statistical modeling of metal-gate Work-Function Variability in emerging device technologies and implications for circuit design

Hamed F. Dadgour, Vivek De, Kaustav Banerjee · 2008 · 62 citations

Engineering, Semiconductor Device, Physical Design (Electronics) +19