Benjamin Orr

Powered system-level conductive TLP probing method for ESD/EMI hard fail and soft fail threshold evaluation

Thomas Schwingshackl, Benjamin Orr, Joost Willemen et al. · Electrical Overstress/Electrostatic Discharge Symposium · 2013 · 21 citations

Engineering, Computer Engineering, Electrical Engineering +9

Identification of Soft Failure Mechanisms Triggered by ESD Stress on a Powered USB 3.0 Interface

Sebastian Koch, Benjamin Orr, Horst Gieser et al. · IEEE Transactions on Electromagnetic Compatibility · 2018 · 15 citations

Engineering, Electrical Engineering, Systems Engineering +17

Silicon Reliability Characterization of Intel’s Foveros 3D Integration Technology for Logic-on-Logic Die Stacking

Sunny Chugh, Hannes Greve, I-chen Ho et al. · 2020 · 15 citations

Engineering, Computer Engineering, Electrical Engineering +17

A systematic method for determining soft-failure robustness of a subsystem

Pratik Maheshwari, Benjamin Orr, Harald Goßner et al. · Electrical Overstress/Electrostatic Discharge Symposium · 2013 · 14 citations

Engineering, Computer Engineering, Systems Engineering +13

A Reliability Overview of Intel’s 10+ Logic Technology

R. Grover, Tony Acosta, C. AnDyke et al. · 2020 · 14 citations

Engineering, Computer Engineering, Electrical Engineering +17