Statistics
Publications
12
Citations
389
H-Index
11
Active since
2002
M. Ishiko is an author at Toyota Central Research and Development Laboratories (Japan) specializing in electrical engineering, engineering, and semiconductor devices.
Publications per year
2002–2011
12
12
Neutron induced single-event burnout of IGBT
T. Shoji, Shuichi Nishida, T. Ohnishi et al. · 2010 · 32 citations
Cosmic ray ruggedness of IGBTs for hybrid vehicles
Shuichi Nishida, T. Shoji, T. Ohnishi et al. · 2010 · 30 citations
Engineering, Automotive Engineering, Electrical Engineering +17
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