Arthur D. van Rheenen

Author

Norwegian Defence Research Establishment

Also Known As

A D van Rheenen, A. D. VAN RHEENEN, A. D. Van Rheenen, A. D. van Rheenen, A. D.van Rheenen, A.D van Rheenen, A.D. Van Rheenen, A.D. van RHEENEN, A.D. van Rheenen, A.D.van Rheenen

Publications

445

Citations

H-Index

Concepts

All Affiliations

Norwegian Defence Research Establishment University of Minnesota Qinetiq (United Kingdom)University of Florida UiT The Arctic University of Norway

About

Arthur D. van Rheenen is an author at Norwegian Defence Research Establishment specializing in engineering, applied physics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	13	17	302
2	Applied Physics	12	15	257
3	Electrical Engineering	11	11	203
4	Natural Sciences	3	3	58
5	Education	1	1	16

Arthur D. van Rheenen

Publications

333

Citations

H-Index

Page 1

	Year	Citations
Low frequency noise measurements as a tool to analyze deep-level impurities in semiconductor devices Arthur D. van Rheenen, G. Bosman, R.J.J. Zijlstra Solid-State Electronics Semiconductor TechnologySemiconductor DevicesElectrical EngineeringEngineeringElectronic Engineering	1987	49
Detection and identification of explosives hidden under barrier materials: what are the THz-technology challenges? Arthur D. van Rheenen, Magnus W. Haakestad Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Thz PhotonicsTerahertz TechnologyEngineeringThz RadiationBarrier Materials	2011	24
Burst-type noise mechanisms in bipolar transistors Xuewang Wu, A. van der Ziel, Alexios Birbas, Solid-State Electronics Electrical EngineeringEngineeringElectronic EngineeringBias Temperature InstabilityNoise	1989	23
Decomposition of generation-recombination noise spectra in separate Lorentzians Arthur D. van Rheenen, G. Bosman, C. M. Van Vliet Solid-State Electronics EngineeringPhysicsNatural SciencesParticle PhysicsSeparate Lorentzians	1985	22
Effect of electrical and thermal stress on low-frequency noise characteristics of laser diodes Xuyuan Chen, Anders Tegtmeier Pedersen, Arthur D. van Rheenen Microelectronics Reliability Electrical EngineeringThermal StressEngineeringLaser ScienceLaser Diodes	2001	21
Comparison of terahertz technologies for detection and identification of explosives R. Beigang, S.G. Biedroń, Sławomir Dyjak, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE	2014	21
Low-frequency noise in heterojunction FETs with low-temperature buffer S. Tehrani, Arthur D. van Rheenen, M.M. Hoogstra, IEEE Transactions on Electron Devices Semiconductor TechnologyElectrical EngineeringEngineeringAlgaas Supply LayerElectronic Engineering	1992	17
Influence of magnetic field on 1/<i>f</i> noise in GaAs resistors without surface effects Myong-Ho Song, A. N. Birbas, A. van der Ziel, Journal of Applied Physics Semiconductor TechnologyMagnetismElectrical EngineeringSpintronicsGaas Resistors	1988	16
1/<i>f</i> noise characterization of <i>n</i>+–<i>p</i> and <i>n</i>–<i>i</i>–<i>p</i> Hg1−<i>x</i>Cd<i>x</i>Te detectors A. van der Ziel, Peng Fang, Li He, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films PhotonicsEngineeringRadiation DetectionPhysicsMeasurement	1989	16
Channel length dependence of the 1/<i>f</i> noise in silicon metal-oxide-semiconductor field-effect transistors. II. Verification of the acceleration 1/<i>f</i> noise process Qiangxiang Peng, A. N. Birbas, A. van der Ziel, Journal of Applied Physics Device ModelingElectrical EngineeringChannel Length DependenceEngineeringPhysics	1988	15

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