Arthur D. van Rheenen

Low frequency noise measurements as a tool to analyze deep-level impurities in semiconductor devices

Arthur D. van Rheenen, G. Bosman, R.J.J. Zijlstra · Solid-State Electronics · 1987 · 49 citations

Semiconductor Technology, Semiconductor Devices, Electrical Engineering +10

Detection and identification of explosives hidden under barrier materials: what are the THz-technology challenges?

Arthur D. van Rheenen, Magnus W. Haakestad · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2011 · 24 citations

Thz Photonics, Terahertz Technology, Engineering +20

Burst-type noise mechanisms in bipolar transistors

Xuewang Wu, A. van der Ziel, Alexios Birbas et al. · Solid-State Electronics · 1989 · 23 citations

Electrical Engineering, Engineering, Electronic Engineering +3

Decomposition of generation-recombination noise spectra in separate Lorentzians

Arthur D. van Rheenen, G. Bosman, C. M. Van Vliet · Solid-State Electronics · 1985 · 22 citations

Engineering, Physics, Natural Sciences +8

Effect of electrical and thermal stress on low-frequency noise characteristics of laser diodes

Xuyuan Chen, Anders Tegtmeier Pedersen, Arthur D. van Rheenen · Microelectronics Reliability · 2001 · 21 citations

Electrical Engineering, Thermal Stress, Engineering +10