Low frequency noise measurements as a tool to analyze deep-level impurities in semiconductor devices - Concepedia

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Low frequency noise measurements as a tool to analyze deep-level impurities in semiconductor devices

49

Citations

5

References

1987

Year

Arthur D. van Rheenen, G. Bosman, R.J.J. Zijlstra

Solid-State Electronics

Semiconductor TechnologySemiconductor DevicesElectrical EngineeringEngineeringElectronic EngineeringBias Temperature InstabilityApplied PhysicsDeep-level ImpuritiesIntrinsic ImpurityNoiseInstrumentationElectronic PackagingSemiconductor Device

References

	Year	Citations

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