Statistics
Publications
1
Citations
21
H-Index
1
Active since
2009
Affiliations
Cree (China)(Current)
Elif Berkman is an author at Cree (China) specializing in semiconductor defects, dislocations, and dislocations in semiconductors.
Publications per year
2009–2009
1
1
Defect Status in SiC Manufacturing
Elif Berkman, R.T. Leonard, Michael J. Paisley et al. · Materials science forum · 2009 · 21 citations · Full text
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