Derk Rading

Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

Alexander G. Shard, Rasmus Havelund, M. P. Seah et al. · Analytical Chemistry · 2012 · 141 citations

Natural Sciences, Chemistry, Materials Science +15

Dual beam depth profiling of polymer materials: comparison of C ₆₀ and Ar cluster ion beams for sputtering

Derk Rading, Rudolf Moellers, H.‐G. Cramer et al. · Surface and Interface Analysis · 2012 · 77 citations

Natural Sciences, Materials Engineering, Materials Science +16

Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

Alexander G. Shard, Rasmus Havelund, Steven J. Spencer et al. · The Journal of Physical Chemistry B · 2015 · 68 citations

Natural Sciences, Chemistry, Analytical Chemistry +16

Sample Cooling or Rotation Improves C₆₀ Organic Depth Profiles of Multilayered Reference Samples: Results from a VAMAS Interlaboratory Study

Peter Sjövall, Derk Rading, Santanu Ray et al. · The Journal of Physical Chemistry B · 2009 · 63 citations

Natural Sciences, Chemistry, Materials Science +11

Analysis of organic multilayers and 3D structures using Ar cluster ions

E. Niehuis, R. Möllers, Derk Rading et al. · Surface and Interface Analysis · 2012 · 57 citations

Natural Sciences, Materials Science, Physics +16