The Chemical Composition of Animal Cells and Their Intracellular Compartments Reconstructed from 3D Mass Spectrometry

Daniel Breitenstein, Christina E. Rommel, R. Möllers, +2

Angewandte Chemie International Edition

MicroscopyTheir Intracellular CompartmentsSims AnalysisChemical CompositionBiological Mass Spectrometry +23

Chemical effects in C60 irradiation of polymers

R. Möllers, Nunzio Tuccitto, V. Torrisi, +2

Applied Surface Science

Chemical EngineeringEngineeringPhotochemistryPolymer ScienceC60 Irradiation +4

Analysis of organic multilayers and 3D structures using Ar cluster ions

E. Niehuis, R. Möllers, Derk Rading, +2

Surface and Interface Analysis

EngineeringElectron-beam LithographyMicroscopyAr Cluster IonsIon Beam Instrumentation +18

Influence of primary ion bombardment conditions on the emission of molecular secondary ions

Reinhard Kersting, Birgit Hagenhoff, Felix Kollmer, +2

Applied Surface Science

Chemical EngineeringEngineeringAtomic PhysicsMolecular Secondary IonsIon Beam +4

Low energy dual beam depth profiling: influence of sputter and analysis beam parameters on profile performance using TOF-SIMS

Thomas Grehl, R. Möllers, E. Niehuis

Applied Surface Science

EngineeringProfile PerformanceAnalysis Beam ParametersComputer EngineeringInstrumentation +2

High‐spatial‐resolution surface imaging of inorganic and organic structures by multiphoton post‐ionization of sputtered neutrals and time‐of‐flight mass spectrometry

M. Tehorst, R. Möllers, E. Niehuis, +1

Surface and Interface Analysis

Sputtered NeutralsEngineeringMicroscopyOrganic StructuresMultiphoton Ionization +18

Resonant photoionization of sputtered organic molecules by femtosecond UV laser pulses

R. Möllers, M. Terhorst, E. Niehuis, +1

Organic Mass Spectrometry

EngineeringPhotochemistryLaser PhotochemistryMechanistic PhotochemistryApplied Physics +6

Quantification of metal trace contaminants on Si wafer surfaces by Laser-SNMS and TOF-SIMS using sputter deposited submonolayer standards

Albert Schnieders, R. Möllers, M. Terhorst, +3

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

Laser PostionizationEngineeringVacuum DeviceChemistrySilicon On Insulator +22

Detection of micro‐ and nano‐particles in animal cells by ToF‐SIMS 3D analysis

Birgit Hagenhoff, Daniel Breitenstein, Elke Tallarek, +5

Surface and Interface Analysis

Organic depth profiling of C ₆₀ and C ₆₀ /phthalocyanine layers using argon clusters

Taoufiq Mouhib, Claude Poleunis, R. Möllers, +4

Surface and Interface Analysis