P. Kanschat

Defects and recombination in microcrystalline silicon

K. Lips, P. Kanschat, W. Fuhs · Solar Energy Materials and Solar Cells · 2003 · 67 citations

Engineering, Physics, Microfabrication +6

Short circuit properties of Trench-/Field-Stop-IGBTs-design aspects for a superior robustness

T. Laska, G. Miller, M. Pfaffenlehner et al. · 2004 · 61 citations

Device Modeling, Electrical Engineering, Semiconductor Device +14

Identification of non-radiative recombination paths in microcrystalline silicon (μc-Si:H)

P. Kanschat, K. Lips, W. Fuhs · Journal of Non-Crystalline Solids · 2000 · 32 citations

Engineering, Applied Physics, Semiconductor Device Fabrication +2

Bandtails and defects in microcrystalline silicon (μc-Si:H)

W. Fuhs, P. Kanschat, K. Lips · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2000 · 27 citations

Engineering, Bandtail States, Semiconductor Materials +16

Defect and Tail States in Microcrystalline Silicon investigated by pulsed ESR

P. Kanschat, H. Mell, K. Lips et al. · MRS Proceedings · 2000 · 25 citations

Materials Engineering, Engineering, Crystalline Defects +10