J. Dazord

High purity boron nitride thin films prepared by the PDCs route

Hussein Termoss, Bérangère Toury, Arnaud Brioude et al. · Surface and Coatings Technology · 2007 · 35 citations

Materials Science, Boron Nitride, Engineering +8

Growth and characterization of BGaAs and BInGaAs epilayers on GaAs by MOVPE

Philippe Rodriguez, Laurent Auvray, H. Dumont et al. · Journal of Crystal Growth · 2006 · 31 citations

Ii-vi Semiconductor, Electrical Engineering, Engineering +6

Growth and characterization of high quality BxGa1−xAs/GaAs(001) epilayers

H. Dumont, J. Dazord, Y. Monteil et al. · Journal of Crystal Growth · 2002 · 30 citations

Materials Engineering, Electrical Engineering, Engineering +6

Surface segregation of boron in BxGa1−xAs/GaAs epilayers studied by x-ray photoelectron spectroscopy and atomic force microscopy

H. Dumont, D. Rutzinger, C. Vincent et al. · Applied Physics Letters · 2003 · 29 citations

Atomic Force Microscopy, Engineering, Borophene +16

Hexamethyldisilane/propane versus silane/propane precursors: application to the growth of high-quality 3C–SiC on Si

Gabriel Ferro, J. Camassel, Sandrine Juillaguet et al. · Semiconductor Science and Technology · 2003 · 28 citations

Materials Engineering, Materials Science, Chemical Engineering +13