R. Zonca - Concepedia

Author

R. Zonca

STMicroelectronics (Italy)

Also Known As

R Zonca, R. Zonca, Romina Zonca

Publications

664

Citations

H-Index

Concepts

All Affiliations

STMicroelectronics (Italy)Institute for Microelectronics and Microsystems University of Catania

About

R. Zonca is an author at STMicroelectronics (Italy) specializing in applied physics, engineering, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	7	7	613
2	Applied Physics	7	7	613
3	Chemical Engineering	1	1	12
4	Chemistry	1	1	15
5	Computer Engineering	1	1	182

R. Zonca

Publications

623

Citations

H-Index

Page 1

	Year	Citations
Amorphous-to-crystal transition of nitrogen- and oxygen-doped Ge2Sb2Te5 films studied by <i>in situ</i> resistance measurements S. Privitera, E. Rimini, R. Zonca Applied Physics Letters Oxygen-doped Ge2sb2te5 FilmsGe2sb2te5 Thin FilmsEngineeringAmorphous-to-crystal TransitionIi-vi Semiconductor	2004	211
Novel /spl mu/trench phase-change memory cell for embedded and stand-alone non-volatile memory applications F. Pellizzer, A. Pirovano, F. Ottogalli, Non-volatile MemoryElectrical EngineeringEngineeringArray DensityNanoelectronics	2004	182
Crystal nucleation and growth processes in Ge2Sb2Te5 S. Privitera, Corrado Bongiorno, E. Rimini, Applied Physics Letters Crystal NucleationGe2sb2te5 Thin FilmsEngineeringCrystal Growth TechnologyPhase Change Memory	2004	80
Crystallization and phase separation in Ge2+xSb2Te5 thin films S. Privitera, E. Rimini, Corrado Bongiorno, Journal of Applied Physics Materials ScienceMaterial AnalysisEngineeringCrystalline DefectsCrystal Growth Technology	2003	71
Ti diffusion in chalcogenides: a ToF-SIMS depth profile characterization approach S. Alberici, R. Zonca, B. Pashmakov Applied Surface Science EngineeringDiffusion ResistancePhysicsApplied PhysicsCondensed Matter Physics	2004	42
Kinetic Modeling and Dopant Effect on Silicon Deposition: Low Pressure and Plasma Assisted Chemical Vapor Deposition Maurizio Masi, R. Zonca, Sergio Carrà Journal of The Electrochemical Society EngineeringSilicon DepositionDopant PresenceChemistryChemical Deposition	1999	15
Nitridation of Thin Gate or Tunnel Oxides by Nitric Oxide C. Gerardi, R. Zonca, B. Crivelli, Journal of The Electrochemical Society Oxide HeterostructuresMaterials ScienceChemical EngineeringSemiconductor TechnologyEngineering	1999	12
A Novel Method for the Simultaneous Characterization of Bulk Impurities and Surface States by Photocurrent Measurements M. L. Polignano, A. P. Caricato, Alberto Modelli, Journal of The Electrochemical Society	2000	10

Page 1