Statistics
Publications
1
Citations
170
H-Index
1
Active since
2003
Affiliations
IBM (United States)(Current)
W. Hanesch is an author at IBM (United States) specializing in gate oxide interfaces, engineering, and microelectronics.
Publications per year
2003–2003
1
1
Electrical characterization of germanium p-channel MOSFETs
Huiling Shang, H. Okorn-Schimdt, J. A. Ott et al. · IEEE Electron Device Letters · 2003 · 170 citations
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