Tat-Kwan Yu

Computer Experiments for Quality Control by Parameter Design

William J. Welch, Tat-Kwan Yu, Sung Mo Kang et al. · Journal of Quality Technology · 1990 · 375 citations

A statistical polishing pad model for chemical-mechanical polishing

Tat-Kwan Yu, C.C. Yu, M. Orłowski · 2002 · 88 citations

Materials Science, Chemical-mechanical Polishing, Engineering +15

Statistical Performance Modeling and Parametric Yield Estimation of MOS VLSI

Tat-Kwan Yu, Sung Mo Kang, Ibrahim Haji et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1987 · 73 citations

Device Modeling, Electrical Engineering, Physical Design (Electronics) +14

Realistic electromigration lifetime projection of VLSI interconnects

H. Kawasaki, Charles Lee, Tat-Kwan Yu · Thin Solid Films · 1994 · 20 citations

Electrical Engineering, Electromigration Technique, Engineering +7

iEDISON: an interactive statistical design tool for MOS VLSI circuits

Tat-Kwan Yu, Sung‐Mo Kang, I.N. Hajj et al. · 2003 · 19 citations

Engineering, Vlsi Design, Electronic Design +18