Yandong He

Investigation of Self-Heating Effect on Hot Carrier Degradation in Multiple-Fin SOI FinFETs

Hai Jiang, Xiaoyan Liu, Nuo Xu et al. · IEEE Electron Device Letters · 2015 · 46 citations

Electrical Engineering, Semiconductor Device, Engineering +13

Preparation of doxycycline‐imprinted magnetic microspheres by inverse‐emulsion suspension polymerization for magnetic dispersion extraction of tetracyclines from milk samples

Yun‐Kai Lv, Chenxi Zhao, Pan Li et al. · Journal of Separation Science · 2013 · 40 citations

823-mA/mm Drain Current Density and 945-MW/cm² Baliga’s Figure-of-Merit Enhancement-Mode GaN MISFETs With a Novel PEALD-AlN/LPCVD-Si₃N₄ Dual-Gate Dielectric

Hongyue Wang, Jinyan Wang, Mengjun Li et al. · IEEE Electron Device Letters · 2018 · 40 citations

Semiconductors, Recess Mask, Electrical Engineering +13

Mechanism of positive-bias temperature instability in sub-1-nm TaN/HfN/HfO/sub 2/ gate stack with low preexisting traps

N. Sa, Jinfeng Kang, Hong Yang et al. · IEEE Electron Device Letters · 2005 · 34 citations

Low Preexisting Traps, Gate Stack, Electrical Engineering +13

A 2.29pJ/b 112Gb/s Wireline Transceiver with RX 4-Tap FFE for Medium-Reach Applications in 28nm CMOS

Bingyi Ye, Kai Sheng, Weixin Gai et al. · 2022 IEEE International Solid- State Circuits Conference (ISSCC) · 2022 · 33 citations

Engineering, Vlsi Design, Multiplexing +15