Yoshiya Hagimoto

IR sensitivity enhancement of CMOS Image Sensor with diffractive light trapping pixels

Sozo Yokogawa, Itaru Oshiyama, Harumi Ikeda et al. · Scientific Reports · 2017 · 82 citations · Full text

Near-infrared sensitivity enhancement of a back-illuminated complementary metal oxide semiconductor image sensor with a pyramid surface for diffraction structure

Itaru Oshiyama, Sozo Yokogawa, Harumi Ikeda et al. · 2017 · 34 citations

Photoelectric Sensor, Crystalline Silicon, Engineering +13

Characterizing carrier-trapping phenomena in ultrathin SiO2 films by using the x-ray photoelectron spectroscopy time-dependent measurements

Yoshiya Hagimoto, Hiroshi Fujioka, M. Oshima et al. · Applied Physics Letters · 2000 · 26 citations

Materials Science, Oxide Heterostructures, Semiconductor Technology +13

High-Performance and Low-Power CMOS Device Technologies Featuring Metal/High-k Gate Stacks with Uniaxial Strained Silicon Channels on (100) and (110) Substrates

Y. Tateshita, J. Wang, K. Nagano et al. · 2006 · 25 citations

Low-power Electronics, Electrical Engineering, Semiconductor Device +11

Characterization of carrier-trapping phenomena in ultrathin chemical oxides using x-ray photoelectron spectroscopy time-dependent measurements

Yoshiya Hagimoto, Takeshi Fujita, Kanta Ono et al. · Applied Physics Letters · 1999 · 25 citations

Engineering, Chemistry, Silicon On Insulator +17