Statistics
Publications
1
Citations
63
H-Index
1
Active since
1997
Affiliations
IBM (United States)(Current)
K.Y Lee is an author at IBM (United States) specializing in electromigration analysis, materials science, and semiconductor devices.
Publications per year
1997–1997
1
1
Electromigration in 0.25 μm wide Cu line on W
C-K. Hu, K.Y Lee, L. Gignac et al. · Thin Solid Films · 1997 · 63 citations
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