Michele Ghidotti

Random Telegraph Noise Effect on the Programmed Threshold-Voltage Distribution of Flash Memories

Christian Monzio Compagnoni, Michele Ghidotti, Andrea L. Lacaita et al. · IEEE Electron Device Letters · 2009 · 97 citations

Engineering, Computer Engineering, Electrical Engineering +16

Investigation of the threshold voltage instability after distributed cycling in nanoscale NAND Flash memory arrays

Christian Monzio Compagnoni, Carmine Miccoli, Riccardo Mottadelli et al. · 2010 · 41 citations

Engineering, Computer Engineering, Electrical Engineering +17

Investigation of the Random Telegraph Noise Instability in Scaled Flash Memory Arrays

Alessandro S. Spinelli, Christian Monzio Compagnoni, R. Gusmeroli et al. · Japanese Journal of Applied Physics · 2008 · 34 citations

Engineering, Computer Engineering, Electrical Engineering +17

Fundamental Limitations to the Width of the Programmed <formula formulatype="inline"><tex Notation="TeX"> $V_{T}$</tex></formula> Distribution of <emphasis emphasistype="smcaps">nor</emphasis> Flash Memories

Christian Monzio Compagnoni, Luca Chiavarone, Marcello Calabrese et al. · IEEE Transactions on Electron Devices · 2010 · 15 citations

Engineering, Computer Engineering, Electrical Engineering +12

Data Retention and Program/Erase Sensitivity to the Array Background Pattern in Deca-nanometer nand Flash Memories

Christian Monzio Compagnoni, A. Ghetti, Michele Ghidotti et al. · IEEE Transactions on Electron Devices · 2009 · 12 citations

Engineering, Computer Engineering, Electrical Engineering +16