Concepedia

Author

Chris Olsen

Applied Materials (United States)ORCID

Also Known As

C S Olsen, C. Olsen, C. S. Olsen, C.S. Olsen, Chloe Olsen, Chris Olsen, Chris S Olsen, Chris S. Olsen, Olsen, Chris

69

Publications

854

Citations

16

H-Index

64

Concepts

All Affiliations

Applied Materials (United States)Indian Institute of Technology BombayUniversity of HoustonUniversity of MichiganSpaceX (United States)
CO

About

Chris Olsen is an author at Applied Materials (United States) specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

16

24

723

2

Applied Physics

12

14

473

3

Computer Engineering

8

8

186

4

Education

1

1

31

5

Natural Sciences

1

1

132

Chris Olsen

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25

Publications

733

Citations

16

H-Index

YearCitations

Ambipolar ion acceleration in an expanding magnetic nozzle

Benjamin Longmier, Edgar A. Bering, Mark D. Carter,

Plasma Sources Science and Technology

2011

132

Material Dependence of NBTI Physical Mechanism in Silicon Oxynitride (SiON) p-MOSFETs: A Comprehensive Study by Ultra-Fast On-The-Fly (UF-OTF) I<inf>DLIN</inf> Technique

E. N. Kumar, V. D. Maheta, S. Purawat,

2007

55

VX-200 Magnetoplasma Thruster Performance Results Exceeding Fifty-Percent Thruster Efficiency

Benjamin Longmier, Leonard Cassady, Maxwell G. Ballenger,

Journal of Propulsion and Power

2011

53

Temperature gradients due to adiabatic plasma expansion in a magnetic nozzle

J. P. Sheehan, Benjamin Longmier, Edgar A. Bering,

Plasma Sources Science and Technology

2014

44

A comprehensive study of flicker noise in plasma nitrided SiON p-MOSFETs: process dependence of pre-existing and NBTI stress generated trap distribution profiles

G. Kapila, Natasha Goyal, V. D. Maheta,

2008

44

Improved Efficiency and Throttling Range of the VX-200 Magnetoplasma Thruster

Benjamin Longmier, Jared Squire, Chris Olsen,

Journal of Propulsion and Power

2014

43

Effect of SiN on Performance and Reliability of Charge Trap Flash (CTF) Under Fowler–Nordheim Tunneling Program/Erase Operation

C. Sandhya, Udayan Ganguly, Nihit Chattar,

IEEE Electron Device Letters

2009

36

VASIMR Performance Results

Leonard Cassady, Benjamin Longmier, Chris Olsen,

2010

31

Nitride Engineering for Improved Erase Performance and Retention of TANOS NAND Flash Memory

G. Van den bosch, A. Furnémont, M. B. Zahid,

2008

30

Impact of SiN Composition Variation on SANOS Memory Performance and Reliability Under nand (FN/FN) Operation

C. Sandhya, Apoorva B. Oak, Nihit Chattar,

IEEE Transactions on Electron Devices

2009

30

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