Concepedia
Statistics
Publications
1
Citations
29
H-Index
Active since
1987
Sumi KUBOSHIMA is an author specializing in gate oxide degradation, engineering, and metal-oxide-semiconductor field-effect transistors.
Publications per year
1987–1987
The Effect of Charge Build-up on Gate Oxide Breakdown during Dry Etching
Kazuyuki Tsunokuni, Kazuo Nojiri, Sumi KUBOSHIMA et al. · 1987 · 29 citations
Engineering, Electrical Engineering, Materials Science +16
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