Concepedia

Uwe Scheithauer

US

5

Publications

389

Citations

5

H-Index

1986

Active since

Affiliations

Siemens (Germany)(Current)

Uwe Scheithauer is an author at Siemens (Germany) specializing in engineering, applied physics, and instrumentation.

ORCID

Top concepts

Publications per year

1986–2011

5

Publications

5

A new LEED instrument for quantitative spot profile analysis

Uwe Scheithauer, Gerd Meyer, M. Henzler · Surface Science · 1986 · 298 citations · Full text

, , +7

Investigation of Pt Bottom Electrodes for "In-Situ" Deposited Pb(Zr,Ti)O<sub>3</sub> (PZT) thin Films

R. Bruchhaus, D. Pitzer, O. Eibl et al. · MRS Proceedings · 1991 · 52 citations

, , +8

Quantitative lateral resolution of a Quantum 2000 X‐ray microprobe

Uwe Scheithauer · Surface and Interface Analysis · 2008 · 16 citations · Full text

, , +17

Evaluation of AES depth profiles of thin‐film systems by application of novel graphically interactive factor analysis software

Uwe Scheithauer, W. Hösler, G. Riedl · Surface and Interface Analysis · 1993 · 13 citations

, , +9

Long time stability of the energy scale calibration of a Quantum 2000

Uwe Scheithauer · Journal of Electron Spectroscopy and Related Phenomena · 2011 · 10 citations · Full text

, , +12

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