A new LEED instrument for quantitative spot profile analysis

A new LEED instrument for quantitative spot profile analysis

Uwe Scheithauer, Gerd Meyer, M. Henzler · Surface Science · 1986 · 299 citations · Full text

Engineering, Geophysics, Instrumentation +3

LEED studies of surface imperfections

M. Henzler · Applications of Surface Science · 1982 · 235 citations

Natural Sciences, Materials Engineering, Materials Science +14

Leed studies of the first stages of deposition and melting of lead on low index faces of copper

J.‐C. HENRION, G.E. Rhead · Surface Science · 1972 · 190 citations

Natural Sciences, Materials Engineering, Materials Science +10

Low-energy electron diffraction from imperfect structures

Jack E. Houston, Robert L. Park · Surface Science · 1970 · 186 citations

Natural Sciences, Materials Science, Physics +14

Epitaxy of Si(111) as studied with a new high resolving LEED system

Klaus-Dieter Gronwald, M. Henzler · Surface Science · 1982 · 161 citations

Natural Sciences, Materials Science, Physics +11