Statistics
Publications
2
Citations
30
H-Index
2
Active since
2005
Affiliations
Tony Hsieh is an author at Advanced Micro Devices (United States) specializing in microelectronics, microfabrication, and electronic packaging.
Publications per year
2005–2007
2
2
Across-wafer CD uniformity control through lithography and etch process: experimental verification
Qiaolin Zhang, Cherry Tang, Jason P. Cain et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2007 · 15 citations
Experimental Verification, Engineering, Electron-beam Lithography +22
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