Jwu E. Chen

Machine Learning-Based Detection Method for Wafer Test Induced Defects

Ken Chau-Cheung Cheng, Leon Li-Yang Chen, Jiwei Li et al. · IEEE Transactions on Semiconductor Manufacturing · 2021 · 55 citations

Engineering, Machine Learning, Machine Learning Algorithms +17

Nested Quantization Index Modulation for Reversible Watermarking and Its Application to Healthcare Information Management Systems

Lu-Ting Ko, Jwu E. Chen, Yaw-Shih Shieh et al. · Computational and Mathematical Methods in Medicine · 2011 · 34 citations · Full text

Engineering, Biometrics, Information Forensics +17

A Multilayer Data Copy Test Data Compression Scheme for Reducing Shifting-in Power for Multiple Scan Design

Shih-Ping Lin, Chung-Len Lee, Jwu E. Chen et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2007 · 30 citations

Hardware Security, Decoding Buffer, Lossy Compression +15

Oscillation ring based interconnect test scheme for SOC

Katherine Shu-Min Li, Chung Len Lee, Chauchin Su et al. · 2005 · 26 citations

Engineering, Hardware Verification Language, Computer Architecture +16

Wafer Defect Pattern Labeling and Recognition Using Semi-Supervised Learning

Katherine Shu-Min Li, Xuhao Jiang, Leon Li-Yang Chen et al. · IEEE Transactions on Semiconductor Manufacturing · 2022 · 24 citations

Root Cause Analysis, Engineering, Machine Learning +19