Katherine Shu-Min Li

Machine Learning-Based Detection Method for Wafer Test Induced Defects

Ken Chau-Cheung Cheng, Leon Li-Yang Chen, Jiwei Li et al. · IEEE Transactions on Semiconductor Manufacturing · 2021 · 55 citations

Engineering, Machine Learning, Machine Learning Algorithms +17

Modeling Attack Resistant PUFs Based on Adversarial Attack Against Machine Learning

Sying-Jyan Wang, Yu-Sheng Chen, Katherine Shu-Min Li · IEEE Journal on Emerging and Selected Topics in Circuits and Systems · 2021 · 29 citations

Engineering, Machine Learning, Information Security +18

Adversarial Attack against Modeling Attack on PUFs

Sying-Jyan Wang, Yu-Shen Chen, Katherine Shu-Min Li · 2019 · 25 citations

Hardware Trojan, Engineering, Machine Learning +16

Wafer Defect Pattern Labeling and Recognition Using Semi-Supervised Learning

Katherine Shu-Min Li, Xuhao Jiang, Leon Li-Yang Chen et al. · IEEE Transactions on Semiconductor Manufacturing · 2022 · 24 citations

Root Cause Analysis, Engineering, Machine Learning +19

Using Tree Structure to Mine High Temporal Fuzzy Utility Itemsets

Tzung‐Pei Hong, Chengyu Lin, Wei-Ming Huang et al. · IEEE Access · 2020 · 23 citations · Full text

Engineering, Business Intelligence, Pattern Discovery +19