Fabian T. von Kleist-Retzow

Line Tension and Drop Size Dependence of Contact Angle at the Nanoscale

Waldemar Klauser, Fabian T. von Kleist-Retzow, Sergej Fatikow · Nanomaterials · 2022 · 18 citations · Full text

Automated Calibration of RF On-Wafer Probing and Evaluation of Probe Misalignment Effects Using a Desktop Micro-Factory

Fabian T. von Kleist-Retzow, Tobias Tiemerding, Patrick Elfert et al. · Journal of Computer and Communications · 2016 · 16 citations · Full text

Automatic Setup, Engineering, Measurement +17

RF wafer probing with improved contact repeatability using nanometer positioning

K. Daffe, G. Dambrine, Fabian T. von Kleist-Retzow et al. · 2016 · 16 citations · Full text

Nanometer Accuracy, Engineering, Radio Frequency +18

Manipulation of Liquid Metal Inside an SEM by Taking Advantage of Electromigration

Fabian T. von Kleist-Retzow, Olaf C. Haenssler, Sergej Fatikow · Journal of Microelectromechanical Systems · 2018 · 16 citations

Materials Science, Electrometallurgy, New Technique +15

Multi-target tracking for automated RF on-wafer probing based on template matching

Hai Li, Fabian T. von Kleist-Retzow, Olaf C. Haenssler et al. · 2019 · 15 citations

Engineering, Radio Frequency, Rf On-wafer +17