S.N. Shabde

Analysis of MOSFET degradation due to hot-electron stress in terms of interface-state and fixed-charge generation

S.N. Shabde, Anjan Bhattacharyya, Ron S. Kao et al. · Solid-State Electronics · 1988 · 61 citations

Engineering, Computer Engineering, Electrical Engineering +16

Ionization Rates in (Al<i>x</i>Ga1−<i>x</i>)As

S.N. Shabde, Chih‐Jung Yeh · Journal of Applied Physics · 1970 · 42 citations

Natural Sciences, Chemistry, Materials Science +10

Snapback Induced Gate Dielectric Breakdown in Graded Junction MOS Structures

S.N. Shabde, G. Simmons, Abhishek Baluni et al. · Reliability physics · 1984 · 22 citations

Engineering, Electrical Engineering, Electronic Materials +16

The buried-source VMOS dynamic RAM device

J.J. Barnes, S.N. Shabde, F.B. Jenne · 1977 · 12 citations

Engineering, Computer Engineering, Electrical Engineering +16

Mechanism of degradation of LDD MOSFETs due to hot-electron stress

Arkka Bhattacharyya, S.N. Shabde · IEEE Transactions on Electron Devices · 1988 · 12 citations

Engineering, Electrical Engineering, Electronic Materials +13