Maheshwar Chandrasekar

Guided test generation for isolation and detection of embedded trojans in ics

Mainak Banga, Maheshwar Chandrasekar, Lei Fang et al. · 2008 · 86 citations

Hardware Trojan, Engineering, Information Security +16

Search State Compatibility Based Incremental Learning Framework and Output Deviation Based X-filling for Diagnostic Test Generation

Maheshwar Chandrasekar, Nikhil Rahagude, Michael S. Hsiao · Journal of Electronic Testing · 2010 · 11 citations

Search State Compatibility, Engineering, Machine Learning +14

A novel diagnostic test generation methodology and its application in production failure isolation

M. Enamul Amyeen, Dongok Kim, Maheshwar Chandrasekar et al. · 2016 · 11 citations

Engineering, Industrial Engineering, Diagnosis +23

Fast circuit topology based method to configure the scan chains in Illinois Scan architecture

Swapneel B. Donglikar, Mainak Banga, Maheshwar Chandrasekar et al. · 2009 · 10 citations

Engineering, Computer Architecture, Illinois Scan Architecture +19