Tom Tong

Current Image Atomic Force Microscopy (CI-AFM) Combined with Atomic Force Probing (AFP) for Location and Characterization of Advanced Technology Node

Tom Tong, Andrew Erickson · Proceedings - International Symposium for Testing and Failure Analysis · 2004 · 27 citations

Tenth Micron Milestone, Engineering, Microscopy +19

E-Core Implementation in Intel 4 with PowerVia (Backside Power) Technology

M. Shamanna, Eli Abuayob, G. Aenuganti et al. · 2023 · 24 citations

Laser Logic State Imaging (LLSI)

Grace Mei Ee Khoo, Yuan-Chuan Steven Chen, F. W. Chapman et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2014 · 23 citations

Engineering, Microscopy, Optical Testing +20

Electron Beam Probing of Active Advanced FinFET Circuit with Fin Level Resolution

Tom Tong, Hyun-Hee Ryu, Yuxiao Wang et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2018 · 15 citations

Electrical Engineering, Engineering, Vlsi Design +15

High Resolution Electron Beam Induced Resistance Change for Fault Isolation with 100 nm2 Localization

Brett A. Buchea, Christopher S. Butler, Hyun-Hee Ryu et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2015 · 10 citations