A. Nagy

Drain resistance degradation under high fields in AlInAs/GaInAs MODFETs

A. S. Wakita, Hans Rohdin, Chung‐Yi Su et al. · 2002 · 22 citations

Engineering, Electrical Engineering, Materials Science +14

Semi-analytical analysis for optimization of 0.1-μm InGaAs-channel MODFETs with emphasis on on-state breakdown and reliability

Hans Rohdin, Chung‐Yi Su, N. Moll et al. · 2002 · 20 citations

Engineering, Electrical Engineering, Materials Science +17

Low-Noise Bias Reliability of AlInAs/GaInAs Modulation-Doped Field Effect Transistors with Linearly Graded Low-Temperature Buffer Layers Grown on GaAs Substrates

A. S. Wakita, Hans Rohdin, V. M. Robbins et al. · Japanese Journal of Applied Physics · 1999 · 16 citations

Engineering, Electrical Engineering, Materials Science +17

Low-noise bias reliability of AlInAs/GaInAs MODFETs with linearly graded low-temperature buffer layers grown on GaAs substrates

A. S. Wakita, Hans Rohdin, V. M. Robbins et al. · 2002 · 14 citations

Engineering, Electrical Engineering, Materials Science +12

Low-noise, high-speed Ga/sub 0.47/In/sub 0.53/As/Al/sub 0.48/In/sub 0.52/As 0.1-μm MODFETs and high-gain/bandwidth three-stage amplifier fabricated on GaAs substrate

Hans Rohdin, A. Nagy, V. M. Robbins et al. · 2002 · 12 citations

Engineering, Electrical Engineering, Materials Science +17