Chung‐Yi Su

New and unified model for Schottky barrier and III–V insulator interface states formation

W. E. Spicer, P. W. Chye, Perry Skeath et al. · Journal of Vacuum Science and Technology · 1979 · 927 citations

Engineering, Cleavage Surface, Fermi-level Pinning +17

Unified Mechanism for Schottky-Barrier Formation and III-V Oxide Interface States

W. E. Spicer, I. Lindau, Perry Skeath et al. · Physical Review Letters · 1980 · 725 citations

Semiconductors, Materials Science, Electrical Engineering +12

Unified defect model and beyond

W. E. Spicer, I. Lindau, Perry Skeath et al. · Journal of Vacuum Science and Technology · 1980 · 644 citations

Software Maintenance, Engineering, Unified Defect Model +24

Photoemission studies of the silicon-gold interface

L. Braicovich, C. Michael Garner, Perry Skeath et al. · Physical review. B, Condensed matter · 1979 · 176 citations

Electron-spectroscopic studies of the early stages of the oxidation of Si

C. Michael Garner, I. Lindau, Chung‐Yi Su et al. · Physical review. B, Condensed matter · 1979 · 169 citations

Engineering, Adsorption Stage, Oxidation Resistance +17