Concepedia

C. T. Haywood

CT

Statistics

Publications

5

Citations

204

H-Index

5

Active since

1968

Affiliations

Texas Instruments (United States)(Current)

C. T. Haywood is an author at Texas Instruments (United States) specializing in natural sciences, materials science, and materials engineering.

Publications per year

1968–1972

5

Publications

5

ELECTROMIGRATION-INDUCED FAILURES IN ALUMINUM FILM CONDUCTORS

J.C. Blair, P. B. Ghate, C. T. Haywood · Applied Physics Letters · 1970 · 56 citations

Natural Sciences, Materials Engineering, Materials Science +17

Corrosion Resistance of Several Integrated-Circuit Metallization Systems

James A. Cunningham, C.R. Fuller, C. T. Haywood · IEEE Transactions on Reliability · 1970 · 55 citations

Natural Sciences, Materials Engineering, Materials Science +17

Electromigration-Induced Failures in, and Microstructure and Resistivity of, Sputtered Gold Films

J.C. Blair, C.R. Fuller, P. B. Ghate et al. · Journal of Applied Physics · 1972 · 41 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Electrical resistivity measurements in palladium–hydrogen alloys

C. T. Haywood, L. Verdini · Canadian Journal of Physics · 1968 · 27 citations

Natural Sciences, Materials Engineering, Materials Science +13

Concerning electromigration in thin films

J.C. Blair, P. B. Ghate, C. T. Haywood · Proceedings of the IEEE · 1971 · 25 citations

Natural Sciences, Electrical Engineering, Physics +17

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