J. A. Mroczkowski

The impact of characterization techniques on HgCdTe infrared detector technology

M. B. Reine, K. R. Maschhoff, S. P. Tobin et al. · Semiconductor Science and Technology · 1993 · 81 citations

Electrical Engineering, Photoelectric Sensor, Engineering +14

Optical absorption below the absorption edge in Hg1−<i>x</i>Cd<i>x</i>Te

J. A. Mroczkowski, D. A. Nelson · Journal of Applied Physics · 1983 · 48 citations

Liquid Phase Epitaxial Growth of  ( Hg1 − x Cd x  ) Te from Tellurium‐Rich Solutions Using a Closed Tube Tipping Technique

J. A. Mroczkowski, H. R. Vydyanath · Journal of The Electrochemical Society · 1981 · 43 citations

Thin Film Physics, Engineering, Crystal Growth Technology +17

Lifetime measurement in Hg0.7Cd0.3Te by population modulation

J. A. Mroczkowski, J. F. Shanley, M. B. Reine et al. · Applied Physics Letters · 1981 · 34 citations · Full text

Optical Materials, Engineering, Optical Transmission System +20

Preparation and properties of Pb-xCdxS

A. R. Calawa, J. A. Mroczkowski, T. C. Harman · Journal of Electronic Materials · 1972 · 30 citations

X-ray Crystallography, Materials Science, Inorganic Chemistry +6