Emil Pinčík - Concepedia

Author

Emil Pinčík

Institute of Physics of the Slovak Academy of Sciences

Also Known As

E Pincik, E Pincík, E Pinc̆ı́k, E Pinčı́k, E. Pincik, E. Pincík, E. Pincı́k, E. Pinc̆ik, E. Pinčik, E. Pinčík

136

Publications

735

Citations

H-Index

Concepts

All Affiliations

Institute of Physics of the Slovak Academy of Sciences Slovak Academy of Sciences Slovak University of Technology in Bratislava The University of Osaka Comenius University Bratislava

About

Emil Pinčík is an author at Institute of Physics of the Slovak Academy of Sciences specializing in applied physics, engineering, and surface science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	12	15	420
2	Applied Physics	12	16	442
3	Natural Sciences	6	6	253
4	Chemistry	4	4	215
5	Electrical Engineering	4	4	72

Emil Pinčík

Publications

502

Citations

H-Index

Page 1

	Year	Citations
Reactivity of Au with ultrathin Si layers: A photoemission study J. Ivančo, Hikaru Kobayashi, J. Almeida, Journal of Applied Physics Materials ScienceSemiconductorsUltrathin Si LayersReactivity MechanismEngineering	2001	137
FT IR spectroscopy of silicon oxide layers prepared with perchloric acid Martin Kopáni, Milan Mikula, Masatoshi Takahashi, Applied Surface Science EngineeringInfrared SensorNatural SciencesSpectroscopyPerchloric Acid	2012	42
Evidence for the Improved Defect-Pool Model for Gap States in Amorphous Silicon from Charge DLTS Experiments on Undoped<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi mathvariant="italic">a</mml:mi></mml:math>-Si:H Vojtěch Nádaždy, R. Durný, Emil Pinčík Physical Review Letters EngineeringCharge Dlts TechniqueDefect ToleranceSemiconductor DeviceSemiconductors	1997	38
Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings M. Jergel, Tilo Baumbach, E. Majková, Journal of Physics D Applied Physics	2001	34
Complete optical characterization of the SiO <sub>2</sub> /Si system by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy Daniel Franta, Emil Pinčík, Miloslav Ohlídal Surface and Interface Analysis	1999	26
Effect of etching time on structure of p-type porous silicon Martin Kopáni, Milan Mikula, Daniel Kosnáč, Applied Surface Science Materials ScienceMaterials EngineeringEngineeringMicrofabricationSurface Science	2018	24
Some peculiar features of small-signal charge DLTS response of GaAs MOS capacitors I. Thurzo, Emil Pinčík physica status solidi (a) SemiconductorsWide-bandgap SemiconductorElectrical EngineeringElectronic DevicesPeculiar Features	1984	23
FT IR spectroscopy of nitric acid oxidation of silicon with hafnium oxide very thin layer Martin Kopáni, Milan Mikula, Emil Pinčík, Applied Surface Science Oxidation ResistanceNatural SciencesSpectroscopySilicon On InsulatorApplied Physics	2014	22
Current-voltage characteristics and charge DLTS spectra of proton-bombarded Schottky diodes on semi-insulating GaAs I. Thurzo, L. Hrubčín, J Bartoš, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms Semiconductor TechnologyElectrical EngineeringSemiconductor DeviceEngineeringCharge Dlts Spectra	1993	20
Multifractal analysis of textured silicon surfaces Stanislav Jurečka, H. Angermann, Hikaru Kobayashi, Applied Surface Science Geometric ModelingTextured Silicon SurfacesEngineeringPhysicsMicrofabrication	2014	20

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