Mark A. Wendman

Short cantilevers for atomic force microscopy

D. A. Walters, J. P. Cleveland, Neil H. Thomson et al. · Review of Scientific Instruments · 1996 · 488 citations

Engineering, Microscopy, Mechanical Engineering +20

As-deposited superconducting Y-Ba-Cu-O thin films on Si, Al2O3, and SrTiO3 substrates

Richard M. Silver, A. B. Berezin, Mark A. Wendman et al. · Applied Physics Letters · 1988 · 101 citations

Materials Science, Superconducting Material, Electron Beam Evaporator +13

Rapid imaging of calcite crystal growth using atomic force microscopy with small cantilevers

George T. Paloczi, Paul K. Hansma, D. A. Walters et al. · Applied Physics Letters · 1998 · 72 citations

Atomic Force Microscopy, Engineering, Microscopy +17

Quantitative two-dimensional dopant profiling of abrupt dopant profiles by cross-sectional scanning capacitance microscopy

Yuping Huang, C. C. Williams, Mark A. Wendman · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1996 · 44 citations

Engineering, Microscopy, Dopant Density +18

<title>Atomic force microscope for small cantilevers</title>

Tilman E. Schaeffer, Mario Viani, D. A. Walters et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1997 · 34 citations

Afm Head, Engineering, Microscopy +15