Molecular mechanistic origin of the toughness of natural adhesives, fibres and composites

Tilman E. Schäffer, Mario Viani, James B. Thompson, +6

Nature

Materials ScienceMolecular Mechanistic OriginFiber ReinforcementEngineeringAdhesive Material +6

Small cantilevers for force spectroscopy of single molecules

Mario Viani, Tilman E. Schäffer, Ami Chand, +3

Journal of Applied Physics

EngineeringMicroscopyMechanical EngineeringSmall Rectangular CantileversMicromachines +19

Probing protein-protein interactions in real time.

Mario Viani, Lı́a I. Pietrasanta, James B. Thompson, +6

Nature Structural Biology

InteractomicsProtein FoldingProtein AnalysisMolecular BiologyProtein Modeling +4

Fast imaging and fast force spectroscopy of single biopolymers with a new atomic force microscope designed for small cantilevers

Mario Viani, Tilman E. Schäffer, George T. Paloczi, +9

Review of Scientific Instruments

EngineeringFast ImagingMicroscopyForced UnfoldingFast Force Spectroscopy +21

Finite optical spot size and position corrections in thermal spring constant calibration

Roger Proksch, Tilman E. Schäffer, J. P. Cleveland, +2

Nanotechnology

EngineeringMeasurementMicroscopyOptical TestingMechanical Engineering +23

Practical loss tangent imaging with amplitude-modulated atomic force microscopy

Roger Proksch, Marta Kocuń, Donna Hurley, +3

Journal of Applied Physics

Materials ScienceAtomic Force MicroscopyAcoustic MicroscopyAfm Loss TangentEngineering +13

Microfabricated small metal cantilevers with silicon tip for atomic force microscopy

A. Chand, Mario Viani, Tilman E. Schäffer, +1

Journal of Microelectromechanical Systems

Atomic Force MicroscopyGold CantileversEngineeringMicroscopyMechanical Engineering +14

<title>Atomic force microscope for small cantilevers</title>

Tilman E. Schaeffer, Mario Viani, D. A. Walters, +5

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Afm HeadEngineeringMicroscopyMicrofabricationAtomic Force Microscope +13

Atomic force microscope detector drift compensation by correlation of similar traces acquired at different setpoints

Johannes H. Kindt, James B. Thompson, Mario Viani, +1

Review of Scientific Instruments

EngineeringMicroscopyMeasurementInstrumentation EngineeringSensor Technology +16

<title>Atomic force microscopy using small cantilevers</title>

D. A. Walters, Mario Viani, George T. Paloczi, +6

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Atomic Force MicroscopyEngineeringMicroscopyNanotechnologyMicrofabrication +12