Wen-Wei Yeh

A high-k Y2O3 charge trapping layer for nonvolatile memory application

Tung-Ming Pan, Wen-Wei Yeh · Applied Physics Letters · 2008 · 32 citations

Materials Science, Semiconductors, Electrical Engineering +15

High-Performance High-$k$$\hbox{Y}_{2}\hbox{O}_{3}$ SONOS-Type Flash Memory

Tung-Ming Pan, Wen-Wei Yeh · IEEE Transactions on Electron Devices · 2008 · 26 citations

Threshold Voltage Shift, Electrical Engineering, Memory Architecture +15

Influence of oxygen content on the structural and electrical characteristics of thin neodymium oxide gate dielectrics

Tung-Ming Pan, Jian-Der Lee, Wen-Wei Yeh · Journal of Applied Physics · 2007 · 25 citations

Engineering, Thin Film Process Technology, Silicon On Insulator +19

Physical and Electrical Properties of Lanthanum Oxide Dielectrics with Al and Al∕TaN Metal Gates

Tung-Ming Pan, Chunlin Chen, Wen-Wei Yeh et al. · Electrochemical and Solid-State Letters · 2007 · 18 citations

Aluminium Nitride, Engineering, Silicon On Insulator +20

Design innovations to optimize the 3D stackable vertical gate (VG) NAND flash

Chun-Hsiung Hung, Hang-Ting Lue, Shuo-Nan Hung et al. · 2012 · 10 citations