Guolin Yu

Optical properties of wurtzite structure GaN on sapphire around fundamental absorption edge (0.78–4.77 eV) by spectroscopic ellipsometry and the optical transmission method

Guolin Yu, G. Wang, Hiroyasu Ishikawa et al. · Applied Physics Letters · 1997 · 285 citations

Wide-bandgap Semiconductor, Optical Materials, Engineering +23

Optical phonon frequencies and damping in AlAs, GaP, GaAs, InP, InAs and InSb studied by oblique incidence infrared spectroscopy

D. J. Lockwood, Guolin Yu, N. L. Rowell · Solid State Communications · 2005 · 133 citations

Optical Materials, Optical Phonon Frequencies, Engineering +10

Refractive index and degree of inhomogeneity of nanocrystalline TiO2 thin films: Effects of substrate and annealing temperature

Md. Mosaddeq-ur-Rahman, Guolin Yu, Tetsuo Soga et al. · Journal of Applied Physics · 2000 · 78 citations

Optical Materials, Engineering, Surface Nanotechnology +20

Determination of optical constants of solgel-derived inhomogeneous TiO_2 thin films by spectroscopic ellipsometry and transmission spectroscopy

Md. Mosaddeq-ur-Rahman, Guolin Yu, Kalaga Murali Krishna et al. · Applied Optics · 1998 · 64 citations

Optical Materials, Engineering, Inorganic Photochemistry +16

Optical properties of AlxGa1−xN/GaN heterostructures on sapphire by spectroscopic ellipsometry

Guolin Yu, Hiroyasu Ishikawa, M. Umeno et al. · Applied Physics Letters · 1998 · 63 citations

Materials Science, Transition Energy, Electrical Engineering +15