X. J. Zhou

Electronic evidence of temperature-induced Lifshitz transition and topological nature in ZrTe5

Yan Zhang, Chenlu Wang, Yu Li et al. · Nature Communications · 2017 · 263 citations · Full text

Physical mechanisms of negative-bias temperature instability

Leonidas Tsetseris, X. J. Zhou, Daniel M. Fleetwood et al. · Applied Physics Letters · 2005 · 138 citations · Full text

H Release Mechanism, First-principles Calculations, Engineering +11

Polaron coherence condensation as the mechanism for colossal magnetoresistance in layered manganites

N. Mannella, Wanli Yang, Kiyohisa Tanaka et al. · Physical Review B · 2007 · 67 citations · Full text

Hydrogen in MOSFETs – A primary agent of reliability issues

Sokrates T. Pantelides, Leonidas Tsetseris, Sergey N. Rashkeev et al. · Microelectronics Reliability · 2006 · 66 citations · Full text

Reliability Issues, Hydrogen Energy Technology, Electrical Engineering +4

Fully gapped single-particle excitations in lightly doped cuprates

Kyle Shen, T. Yoshida, Dong-Hui Lu et al. · Physical Review B · 2004 · 53 citations · Full text

Finite Gap, Charge Excitations, Low-energy Excitations +13