P.E. Hegeman - Concepedia

Author

P.E. Hegeman

University of Twente

Also Known As

Hegeman, P.E., P. E. Hegeman, P.E. Hegeman, Petra E. Hegeman, Petra Hegeman

Publications

198

Citations

H-Index

Concepts

All Affiliations

University of Twente Philips (Finland)Institute for Atomic and Molecular Physics Philips (Netherlands)A.V. Shubnikov Institute of Crystallography

About

P.E. Hegeman is an author at University of Twente specializing in engineering, applied physics, and physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	6	6	151
2	Applied Physics	5	5	129
3	Natural Sciences	2	2	21
4	Education	1	1	22
5	Materials Engineering	1	1	16

P.E. Hegeman

Publications

176

Citations

H-Index

Page 1

	Year	Citations
Energetics of Ni-Induced Vacancy Line Defects on Si(001) Harold J. W. Zandvliet, H. K. Louwsma, P.E. Hegeman, Physical Review Letters Materials ScienceEngineeringTunneling MicroscopyPhysicsNi-induced Vacancy Line	1995	72
<title>Portable diagnostics for EUV light sources</title> R. Stuik, R. C. Constantinescu, P.E. Hegeman, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Synchrotron RadiationEngineeringExtreme Ultraviolet LithographyMeasurementOptical Diagnostics	2000	22
Single-order operation of lamellar multilayer gratings in the soft x-ray spectral range R. van der Meer, I. V. Kozhevnikov, B. Krishnan, AIP Advances Materials SciencePhotonicsOptical MaterialsX-ray SpectroscopyEngineering	2013	20
Kinetic roughening of vicinal Si(001) P.E. Hegeman, Harold J. W. Zandvliet, Gerhardus A.M. Kip, Surface Science Materials EngineeringMaterials ScienceEngineeringMicrofabricationApplied Physics	1994	16
Improved resolution for soft-x-ray monochromatization using lamellar multilayer gratings R. van der Meer, B. Krishnan, I. V. Kozhevnikov, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE	2011	15
Experimental study of a shearing interferometer concept for at-wavelength characterization of extreme-ultraviolet optics P.E. Hegeman, Xavier Christmann, Matthieu Visser, Applied Optics Optical MaterialsEngineeringOptic DesignOptical TestingInterferometry	2001	11
<title>Characterization of a novel double-gas-jet laser plasma EUV source</title> René de Bruijn, Andrzej Bartnik, H. F. Fledderus, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE	2000	10
<title>Laser-generated water plasma source for extreme-ultraviolet lithography and at-wavelength interferometry</title> R. C. Constantinescu, Jeroen Jonkers, P.E. Hegeman, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Laser-generated Water PlasmaEngineeringLaser-plasma InteractionLaser ApplicationsExtreme-ultraviolet Lithography	2000	10

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