Ralf Hofmann

Metal Nanocrystal Memory With Pt Single- and Dual-Layer NC With Low-Leakage $\hbox{Al}_{2}\hbox{O}_{3}$ Blocking Dielectric

Pawan Kumar Singh, Gaurav Bisht, Ralf Hofmann et al. · IEEE Electron Device Letters · 2008 · 32 citations

Non-volatile Memory, Engineering, Emerging Memory Technology +20

Performance and Reliability Study of Single-Layer and Dual-Layer Platinum Nanocrystal Flash Memory Devices Under NAND Operation

Pawan Kumar Singh, Gaurav Bisht, Kshitij Auluck et al. · IEEE Transactions on Electron Devices · 2010 · 16 citations

Non-volatile Memory, Reliability Study, Engineering +16

Performance and Reliability of Au and Pt Single-Layer Metal Nanocrystal Flash Memory Under nand (FN/FN) Operation

Pawan Kumar Singh, Ralf Hofmann, Kaushal K. Singh et al. · IEEE Transactions on Electron Devices · 2009 · 15 citations

Non-volatile Memory, Engineering, Emerging Memory Technology +17

Reliability of single and dual Layer Pt nanocrystal devices for NAND flash applications: A 2-region model for endurance defect generation

Pawan Kumar Singh, Gaurav Bisht, M Sivatheja et al. · IEEE International Reliability Physics Symposium proceedings · 2009 · 11 citations

Non-volatile Memory, Engineering, Nand Flash Applications +19