Derryl Allman

1 000 000 °C/s thin film electrical heater: <i>In</i> <i>situ</i> resistivity measurements of Al and Ti/Si thin films during ultra rapid thermal annealing

L. H. Allen, Ganpati Ramanath, S. L. Lai et al. · Applied Physics Letters · 1994 · 88 citations

Natural Sciences, Materials Engineering, Materials Science +17

Atomic Layer Deposition of Ruthenium and Ruthenium Oxide Using a Zero-Oxidation State Precursor

Dustin Z. Austin, Melanie A. Jenkins, Derryl Allman et al. · Chemistry of Materials · 2017 · 85 citations

Natural Sciences, Materials Engineering, Materials Science +17

Microstructural aspects and mechanism of the <i>C</i>49-to-<i>C</i>54 polymorphic transformation in titanium disilicide

Zhenqiang Ma, L. H. Allen, Derryl Allman · Journal of Applied Physics · 1995 · 74 citations

Natural Sciences, Materials Engineering, Materials Science +17

Effect of dimension scaling on the nucleation of C54 TiSi2

Zhenqiang Ma, L. H. Allen, Derryl Allman · Thin Solid Films · 1994 · 32 citations

Natural Sciences, Materials Science, Physics +12

Plasma Enhanced Atomic Layer Deposition of Al&lt;sub&gt;2&lt;/sub&gt;O&lt;sub&gt;3&lt;/sub&gt;/SiO&lt;sub&gt;2&lt;/sub&gt; MIM Capacitors

Dustin Z. Austin, Derryl Allman, David Price et al. · IEEE Electron Device Letters · 2015 · 22 citations

Natural Sciences, Materials Engineering, Materials Science +13