Chuanxin Huang

Enhanced Electrical Performance and Negative Bias Illumination Stability of Solution-Processed InZnO Thin-Film Transistor by Boron Addition

De-Yao Zhong, Jun Li, Chengyu Zhao et al. · IEEE Transactions on Electron Devices · 2017 · 42 citations

Engineering, Electrical Engineering, Materials Science +17

Nitrogen anion doping as a strategy to suppress negative gate-bias illumination instability of ZnSnO thin film transistor

Jun Li, Yi-Zhou Fu, Chuanxin Huang et al. · Applied Physics Letters · 2016 · 34 citations

Engineering, Electrical Engineering, Materials Science +16

Effect of La Addition on the Electrical Characteristics and Stability of Solution-Processed LaInO Thin-Film Transistors With High-${k}$ ZrO₂Gate Insulator

Chengyu Zhao, Jun Li, De-Yao Zhong et al. · IEEE Transactions on Electron Devices · 2017 · 33 citations

Engineering, Electrical Engineering, Materials Science +17

Suppression in the Negative Bias Illumination Instability of ZnSnO Thin-Film Transistors Using Hafnium Doping by Dual-Target Magnetron Cosputtering System

Chuanxin Huang, Jun Li, Yi-Zhou Fu et al. · IEEE Transactions on Electron Devices · 2016 · 31 citations

Engineering, Electrical Engineering, Materials Science +16

Temperature stress on a thin film transistor with a novel BaZnSnO semiconductor using a solution process

Jun Li, Chuanxin Huang, Jianhua Zhang et al. · RSC Advances · 2015 · 30 citations

Engineering, Electrical Engineering, Materials Science +16