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Temperature stress on a thin film transistor with a novel BaZnSnO semiconductor using a solution process
30
Citations
19
References
2015
Year
Materials ScienceThin Film TransistorElectrical EngineeringEngineeringOxide ElectronicsBias Temperature InstabilityApplied PhysicsSemiconductor MaterialNovel Baznsno SemiconductorThin Film Process TechnologyThin FilmsTemperature StressThin Film ProcessingSemiconductor Device
This work reports the temperature stress on a thin film transistor based on a novel BaZnSnO semiconductor using a solution process.
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