Concepedia
Statistics
Publications
29
Citations
788
H-Index
16
Active since
1982
Affiliations
University of Warwick(Current)
London Borough of Camden
Universidad Politécnica de Madrid
University of York
Element Six (United Kingdom)
M. G. Dowsett is an author at University of Warwick specializing in materials science, natural sciences, and materials engineering.
Publications per year
1982–2013
An analytic form for the SIMS response function measured from ultra‐thin impurity layers
M. G. Dowsett, G. Rowlands, P. N. Allen et al. · Surface and Interface Analysis · 1994 · 103 citations
Engineering, Materials Engineering, Materials Science +17
Secondary ion mass spectrometry analysis of ultrathin impurity layers in semiconductors and their use in quantification, instrumental assessment, and fundamental measurements
M. G. Dowsett, R. D. Barlow, P. N. Allen · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1994 · 73 citations
Natural Sciences, Chemistry, Materials Science +17
Establishing an accurate depth-scale calibration in the top few nanometers of an ultrashallow implant profile
M. G. Dowsett, S. H. Al-Harthi, T. J. Ormsby et al. · Physical review. B, Condensed matter · 2002 · 68 citations
Natural Sciences, Materials Engineering, Materials Science +17
Diffusion of boron in heavily doped <i>n</i>- and <i>p</i>-type silicon
A. F. W. Willoughby, A G R Evans, P. Champ et al. · Journal of Applied Physics · 1986 · 43 citations
Characterization of sharp interfaces and delta doped layers in semiconductors using secondary ion mass spectrometry
M. G. Dowsett, R. D. Barlow · Analytica Chimica Acta · 1994 · 41 citations
Natural Sciences, Materials Engineering, Materials Science +14
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