Kok-Yong Yiang

Investigation of electrical conduction in carbon-doped silicon oxide using a voltage ramp method

Kok-Yong Yiang, Won Jong Yoo, Qiang Guo et al. · Applied Physics Letters · 2003 · 62 citations · Full text

Semiconductors, Electrical Conduction, Electrical Engineering +15

Stress migration model for Cu interconnect reliability analysis

Heng Yao, Kok-Yong Yiang, Patrick Justison et al. · Journal of Applied Physics · 2011 · 21 citations · Full text

Engineering, Mechanical Engineering, Risk Analysis +22

TDDB Kinetics and their Relationship with the E- and ¿E-models

Kok-Yong Yiang, Heng Yao, Amit Marathe · 2008 · 20 citations

Engineering, Voltage Acceleration, Interconnect (Integrated Circuits) +16

Study of leakage mechanisms of the copper/Black Diamond™ damascene process

Kok-Yong Yiang, Qiang Guo, Won Jong Yoo et al. · Thin Solid Films · 2004 · 15 citations

Materials Engineering, Materials Science, Diamond-like Carbon +4

A simple electrical method for etch bias and process reliability determination

Kok-Yong Yiang, Melida Chin, Amit Marathe et al. · 2010 · 11 citations

Engineering, Process Reliability Windows, System Reliability +19