T. Sakai

Correlation between the electrical properties and the interfacial microstructures of TiAl-based ohmic contacts to p-type 4H-SiC

Susumu Tsukimoto, Koji Nitta, T. Sakai et al. · Journal of Electronic Materials · 2004 · 76 citations

Materials Science, Materials Engineering, Electrical Engineering +11

Electrical properties and microstructure of ternary Ge∕Ti∕Al ohmic contacts to p-type 4H–SiC

Susumu Tsukimoto, T. Sakai, Masanori Murakami · Journal of Applied Physics · 2004 · 37 citations

Engineering, Electrical Properties, Semiconductor Device +16

Simultaneous formation of p- and n-type ohmic contacts to 4H-SiC using the ternary Ni/Ti/Al system

Susumu Tsukimoto, T. Sakai, T. Onishi et al. · Journal of Electronic Materials · 2005 · 37 citations

Materials Science, Materials Engineering, Electrical Engineering +10

Electrical properties of graphite/homoepitaxial diamond contact

Y.G. Chen, Masataka Hasegawa, Hideyo Okushi et al. · Diamond and Related Materials · 2002 · 21 citations

Materials Science, Diamond-like Carbon, Engineering +5

Ternary TiAlGe ohmic contacts for <i>p</i>-type 4H-SiC

T. Sakai, Koji Nitta, Susumu Tsukimoto et al. · Journal of Applied Physics · 2004 · 19 citations

Materials Engineering, Semiconductors, Electrical Engineering +13